Reliability, Yield, and Stress Burn-In : A Unified Approach for Microelectron...

Name: Reliability, Yield, and Stress Burn-In : A Unified Approach for Microelectron...
Price: 182.39 USD
Availability: OutOfStock
Author: Kuo, Way; Chien, Wei-Ting Kary; Kim, Taeho

by Kuo, Way; Chien, Wei-Ting Kary; Kim, Taeho

$182 · Offered by eBay · No longer available

Binding: Hardcover
ISBN: 9780792381075
Condition: Fine

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