Defects and Impurities in Silicon Materials. An Introduction to Atomic-Level Sil

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Artikeldetails Defects and Impurities in Silicon Materials. An Introduction to Atomic-Level Silicon Engineering. Yoshida, Yutaka [Ed.] und Guido [Ed.] Langouche: Springer, 2016. Softcover Sprache: Englisch ISBN: 4431557997 EAN: 9784431557999 Bestell-Nr: 2488308 Bemerkungen: C-02446 Ex-library with Stamp and Library-Signature in Good Condition, Some Traces of Use 9784431557999 EUR 47,50 (inkl. MwSt.) Versandkostenfrei innerhalb Deutschlands Aufgenommen mit whBOOK Sicheres Bestellen - Order-Control gepr ft! Artikel eingestellt mit dem w+h GmbH eBay-Service Daten und Bilder powered by Buchfreund (2026-08-12)

• ISBN: 4431557997

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