Microelectronic Reliability : Reliability, Test and Diagnostics, Hardcover by...

by Edward B. Hakim

$161 · Offered by eBay · No longer available

Microelectronic Reliability : Reliability, Test and Diagnostics, Hardcover by Hakim, Edward B. (EDT), ISBN 0890062846, ISBN-13 9780890062845, Like New Used, Free shipping in the US Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought about by new technologies are also covered. Acidic paper. Annotation copyright Book News, Inc. Portland, Or.

• Publisher: Artech House
• Year: 1989
• Binding: Hardcover
• ISBN: 9780890062845
• Condition: Fine

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